Publications
2-STEP AL/TI METALLIZATION TO PTSI/SI STRUCTURES. Applied Physics Letters. 45:905-907.
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1984. AL/TIW REACTION-KINETICS - INFLUENCE OF CU AND INTERFACE OXIDES. Journal of Applied Physics. 58:3440-3443.
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1985. ANALYSIS OF DIFFUSION IN POLYMERS BY FORWARD RECOIL SPECTROMETRY. Applied Physics Letters. 45:957-959.
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1984. BACKSIDE SECONDARY ION MASS-SPECTROMETRY INVESTIGATION OF OHMIC AND SCHOTTKY CONTACTS ON GAAS. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 8:2079-2083.
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1990. CO/GAAS INTERFACIAL REACTIONS. Journal of Applied Physics. 62:3755-3762.
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1987. Crystallization of amorphous silicon films by pulsed ion beam annealing. Laser-Solid Interactions and Transient Thermal Processing of Materials. :455-60.
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1983. Epitaxy of aluminium films on semiconductors by ionized cluster beam. Layered Structures, Epitaxy, and Interfaces Symposium. :401-6.
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1985. Improved uniformity of reacted GaAs contacts by interface mixing. Layered Structures, Epitaxy, and Interfaces Symposium. :473-8.
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1985. INFLUENCE OF CU AS AN IMPURITY IN AL/TI AND AL/W THIN-FILM REACTIONS. Applied Physics Letters. 43:1015-1017.
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1983. INFLUENCE OF CU AS AN IMPURITY IN AL/V THIN-FILM REACTIONS. Journal of Applied Physics. 58:1838-1840.
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1985. INTERFACIAL REACTION OF MO-W ALLOYS WITH SILICON. Thin Solid Films. 138:245-254.
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1986. Interfacial reactions between In/Pd and GaAs. Phase Transformation Kinetics in Thin Films Symposium. :131-7.
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1991. Ion beam analysis of diffusion in polymer melts. Electronic Packaging Materials Science. Materials Research Society Symposia Proceedings. :265-70.
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1985. LIMITS OF REPTATION IN POLYMER MELTS. Physical Review Letters. 53:2145-2148.
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1984. MARKER DISPLACEMENT MEASUREMENTS OF POLYMER POLYMER INTERDIFFUSION. Macromolecules. 18:501-507.
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1985. PHASE FORMATION AND REACTION-KINETICS IN THE THIN-FILM CO/GAAS SYSTEM. Applied Physics Letters. 47:934-936.
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1985. PHASE-SEPARATION IN INTERACTIONS OF TANTALUM CHROMIUM-ALLOY ON SI. Journal of Vacuum Science & Technology a-Vacuum Surfaces and Films. 1:452-454.
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1983. POLYDISPERSITY EFFECTS ON DIFFUSION IN POLYMERS - CONCENTRATION PROFILES OF D-POLYSTYRENE MEASURED BY FORWARD RECOIL SPECTROMETRY. Journal of Polymer Science Part B-Polymer Physics. 24:1-9.
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1986. PULSED PROTON-BEAM ANNEALING OF IR AND IRXV100-X THIN-FILMS ON SILICON. Journal of Applied Physics. 57:264-269.
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1985. RUTHERFORD BACKSCATTERING DETERMINATION OF IODIDE DISTRIBUTION IN AG(BR,I) SHEET CRYSTAL. Journal of Photographic Science. 33:219-220.
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1985. SILICIDE FORMATION BY THERMAL ANNEALING OF NI AND PD ON HYDROGENATED AMORPHOUS-SILICON FILMS. Applied Physics Letters. 47:236-238.
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1985. Solid phase epitaxial growth of Ge on GaAs. Layered Structures and Epitaxy Symposium. :67-72.
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1986. THIN-FILM INTERACTIONS OF AL AND AL (CU) ON W AND TI. Journal of the Electrochemical Society. 130:C102-C102.
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1983. THIN-FILM INTERACTIONS OF AL AND AL(CU) ON TIW. Journal of Applied Physics. 58:3444-3448.
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1985.