Publications

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Palmstrom C.J, Schwarz S.A, Marshall E.D, Yablonovitch E., Harbison J.P, Schwartz C.L, Florez L., Gmitter T.J, Wang L.C, Lau S.S.  1988.  A high depth resolution backside secondary ion mass spectrometry technique used for studying metal/GaAs contacts. Advanced Surface Processes for Optoelectronics: Symposium. :283-8.
Palmstrøm CJ.  2016.  Heusler Compounds and Spintronics. Progress in Crystal Growth and Characterization of Materials. 62
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Zhu J.G, McKernan S., Palmstrom C.J, C. Carter B.  1990.  High-resolution imaging of CoGa/GaAs and ErAs/GaAs interfaces. Atomic Scale Structure of Interfaces Symposium. :89-94.