Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

TitleDielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters
Publication TypeJournal Article
Year of Publication2008
AuthorsChoi S.G, Aspnes D.E, Stoute N.A, Kim Y.D, Kim H.J, Chang Y.C, Palmstrom C.J
JournalPhysica Status Solidi a-Applications and Materials Science
Volume205
Pagination884-887