In situ electrical determination of reaction kinetics and interface properties at molecular beam epitaxy grown metal/semiconductor interfaces

TitleIn situ electrical determination of reaction kinetics and interface properties at molecular beam epitaxy grown metal/semiconductor interfaces
Publication TypeJournal Article
Year of Publication1999
AuthorsChen L.C, Palmstrom C.J
JournalJournal of Vacuum Science & Technology B
Volume17
Pagination1877-1883